Molina-Mendoza A.J.Island J.O.Paz W.S.Clamagirand J.M.Ares J.R.Flores E.Leardini F.Sánchez C.Agraït, NicolásRubio-Bollinger G.van der Zant H.S.J.Ferrer I.J.Palacios J.J.Castellanos-Gomez A.2020-12-042020-12-042017http://hdl.handle.net/20.500.12614/1345enAtribución-NoComercial-SinDerivadas 3.0 EspañaHigh Current Density Electrical Breakdown of TiS3 Nanoribbon-Based Field-Effect Transistorsresearch article10.1002/adfm.201605647open access