Pimentel C.Varghese S.Yoon S.-J.Park S.Y.Gierschner, JohannesGnecco E.Pina C.M.2020-12-042020-12-042016http://hdl.handle.net/20.500.12614/488enAtribución-NoComercial-SinDerivadas 3.0 EspañaSub-nanometer resolution of an organic semiconductor crystal surface using friction force microscopy in waterresearch article10.1088/0953-8984/28/13/134002open access