Barrett N.Rault J.E.Wang J.L.Mathieu C.Locatelli A.Mentes T.O.Niño M.A.Fusil S.Bibes M.Barthélémy A.Sando D.Ren W.Prosandeev S.Bellaiche L.Vilquin B.Petraru A.Krug I.P.Schneider C.M.2020-12-092020-12-092013http://hdl.handle.net/20.500.12614/2002enAtribución-NoComercial-SinDerivadas 3.0 Españahttp://creativecommons.org/licenses/by-nc-nd/3.0/es/Full field electron spectromicroscopy applied to ferroelectric materialsresearch article10.1063/1.4801968