Rectification Ratio and Tunneling Decay Coefficient Depend on the Contact Geometry Revealed by in Situ Imaging of the Formation of EGaIn Junctions

Chen X.Hu H.Trasobares J.Nijhuis C.A.2020-12-042020-12-042019http://hdl.handle.net/20.500.12614/1777enAtribución-NoComercial-SinDerivadas 3.0 Españahttp://creativecommons.org/licenses/by-nc-nd/3.0/es/Rectification Ratio and Tunneling Decay Coefficient Depend on the Contact Geometry Revealed by in Situ Imaging of the Formation of EGaIn Junctionsresearch article10.1021/acsami.9b02033