Gant P.Niu Y.Svatek S.A.Agraït, NicolásMunuera C.García-Hernández M.Frisenda R.De Lara D.P.Castellanos-Gomez A.2020-12-042020-12-042017http://hdl.handle.net/20.500.12614/1427enAtribución-NoComercial-SinDerivadas 3.0 EspañaLithography-free electrical transport measurements on 2D materials by direct microprobingresearch article10.1039/c7tc01203aopen access