Liu Y.Feng H.Luo F.2020-12-042020-12-042020http://hdl.handle.net/20.500.12614/822enAtribuciĆ³n-NoComercial-SinDerivadas 3.0 EspaƱaQuantitative analysis of the defects in CVD grown graphene by plasmon-enhanced Raman scatteringresearch article10.1016/j.carbon.2020.01.063open access