High throughput characterization of epitaxially grown single-layer MoS2

Ghasemi F.Frisenda R.Dumcenco D.Kis A.de Lara D.P.Castellanos-Gomez A.2020-12-042020-12-042017http://hdl.handle.net/20.500.12614/1316application/pdfenAtribución-NoComercial-SinDerivadas 3.0 EspañaAtribución-NoComercial-SinDerivadas 3.0 EspañaHigh throughput characterization of epitaxially grown single-layer MoS2research article10.3390/electronics6020028open access