RT Journal Article
T1 Correlative atomic force microscopy and localization-based super-resolution microscopy: Revealing labelling and image reconstruction artefacts
A1 Monserrate A., 
A1 Casado S., 
A1 Flors, Cristina
YR 2014
FD 2014
LK http://hdl.handle.net/20.500.12614/2386
UL http://hdl.handle.net/20.500.12614/2386
LA en
DS Repositorio institucional de IMDEA Nanociencia
RD 28 abr. 2026