RT Journal Article
T1 Rectification Ratio and Tunneling Decay Coefficient Depend on the Contact Geometry Revealed by in Situ Imaging of the Formation of EGaIn Junctions
A1 Chen X., 
A1 Hu H., 
A1 Trasobares J., 
A1 Nijhuis C.A., 
YR 2019
FD 2019
LK http://hdl.handle.net/20.500.12614/1777
UL http://hdl.handle.net/20.500.12614/1777
LA en
DS Repositorio institucional de IMDEA Nanociencia
RD 28 abr. 2026