TY  - JOUR
AU  - Román-Sánchez S.
AU  - París Ogáyar M.
AU  - Lorite I.
AU  - Fernández J.F.
AU  - Serrano A.
AU  - Moure A.
PY  - 2024
DO  - 10.1016/j.jmrt.2023.12.155
UR  - http://hdl.handle.net/20.500.12614/3536
T2  - Journal of Materials Research and Technology
LA  - en
M2  - 3882
TI  - Improving the reliability of silicon diodes via manufacturing process modification strategies
TY  - research article
VL  - 28
ER  -