@article{20.500.12614/1575,
year = {2018},
url = {http://hdl.handle.net/20.500.12614/1575},
title = {Epitaxial integration of CoFe 2 O 4 thin films on Si (001) surfaces using TiN buffer layers},
doi = {10.1016/j.apsusc.2017.12.111},
volume = {436},
journal = {Applied Surface Science},
author = {Prieto P. and Marco J.F. and Prieto J.E. and Ruiz-Gómez S. and Pérez, Lucas and del Real R.P. and Vázquez M. and de la Figuera J.},
}