A Flexible Beamline for Ultrafast High-Throughput Microscopy with Extreme Ultraviolet Radiation

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dc.contributor.affiliation000000041762408X
dc.contributor.affiliationLaboratory for Ultrafast X-ray and Electron Microscopy (LUXEM), Department of Physics, University of Pavia, Pavia, I-27100, Italy; Department of Physics, Colorado School of Mines, 1523 Illinois Street, Golden, 80401, CO, United States; X-ray Wave-mixing Spectroscopies Group (X-WaveS), IMDEA Nanociencia, Faraday 9, Madrid, 28049, Spainen
dc.contributor.authorGrova C.
dc.contributor.authorBevis C.S.
dc.contributor.authorGiani N.
dc.contributor.authorAdams D.E.
dc.contributor.authorSvetina, Cristian
dc.contributor.authorMancini G.F.
dc.date.accessioned2025-02-11T16:34:16Z
dc.date.available2025-02-11T16:34:16Z
dc.date.issued2024
dc.identifier.doi10.1364/cleo_si.2024.sm2h.5en
dc.identifier.urihttps://hdl.handle.net/20.500.12614/3913
dc.journal.title2024 Conference on Lasers and Electro-Optics, CLEO 2024en
dc.language.isoenen
dc.relation.projectIDTEMPAir Force Office of Scientific Research, AFOSR, (FA9550-20-1-0143, FA9550-18-1-0089); Air Force Office of Scientific Research, AFOSR; European Union's Horizon 2020 Research and Innovation Program G.A., (851154); European Research Council, ERC, (101067016 HORIZON MSCA-2021-PF-01, 101123123); European Research Council, ERC; National Science Foundation, NSF, (2010359); National Science Foundation, NSF
dc.rightsAtribución-NoComercial-SinDerivadas 3.0 España*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/*
dc.titleA Flexible Beamline for Ultrafast High-Throughput Microscopy with Extreme Ultraviolet Radiationen
dc.typeresearch articleen

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