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Room temperature Mott metal-insulator transition in V2O3compounds induced via strain-engineering

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dc.contributor.affiliationDepartment of Physics and Astronomy, KU Leuven, Celestijnenlaan 200D, Leuven, 3001, Belgium, IMDEA Nanociencia, Cantoblanco, Madrid, E-28049, Spain, Department of Materials Engineering, KU Leuven, Kasteelpark Arenberg 44, Leuven, 3001, Belgium, SENTECH Instruments GmbH, Schwarzschildstr. 2, Berlin, 12489, Germanyen
dc.contributor.affiliation000000041762408X
dc.contributor.authorHomm P.
dc.contributor.authorMenghini, Mariela
dc.contributor.authorSeo J.W.
dc.contributor.authorPeters S.
dc.contributor.authorLocquet J.-P.
dc.date.accessioned2021-03-12T09:15:04Z
dc.date.available2021-03-12T09:15:04Z
dc.date.issued2021
dc.format.mimetypeapplication/pdf
dc.identifier.doi10.1063/5.0035865
dc.identifier.urihttp://hdl.handle.net/20.500.12614/2529
dc.issue.number21116
dc.journal.titleAPL Materials
dc.language.isoen
dc.relation.projectIDinfo:eu:eu-repo/grantAgreement/EC/H2020/688579/EU/PHotonic REServoir COmputing/PHRESCO
dc.relation.projectIDTEMPThe authors acknowledge financial support from the EU H2020 Project No. 688579 PHRESCO and the KU Leuven projects (Grant No. GOA/13/011, Fundamental challenges in Semiconductors, and Grant No. C14/17/080, 2D Oxides). J. W. S and J.-P. L. are also grateful to FWO (AKUL/13/19). We thank Dr. Ruben Lieten for the program to analyze reciprocal space maps data and Dr. Ilse Lenaerts for critical reading of the manuscript. P.H. acknowledges the support from Becas Chile—CONICYT.
dc.rightsAtribución-NoComercial-SinDerivadas 3.0 España*
dc.rightsAtribución-NoComercial-SinDerivadas 3.0 España*
dc.rights.accessRightsopen access
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/*
dc.titleRoom temperature Mott metal-insulator transition in V2O3compounds induced via strain-engineering
dc.typeresearch article
dc.type.hasVersionVoR
dc.volume.number9
dspace.entity.typePublication
relation.isAuthorOfPublication0b925c2e-543e-4f0e-8775-d861b13c6752
relation.isAuthorOfPublication.latestForDiscovery0b925c2e-543e-4f0e-8775-d861b13c6752

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