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Dynamics of quartz tuning fork force sensors used in scanning probe microscopy

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dc.contributor.affiliation"Departamento de Física de la Materia Condensada (C-III), Universidad Autónoma de Madrid, Campus de Cantoblanco, Madrid 28049, Spain"," Instituto Universitario de Ciencia de Materiales Nicols Cabrera, Spain"," Instituto Madril?o de Estudios Avanzados en Nanociencia IMDEA-Nanociencia, Madrid 28049, Spain"en
dc.contributor.affiliation000000041762408X
dc.contributor.authorCastellanos-Gomez A.
dc.contributor.authorAgraït, Nicolás
dc.contributor.authorRubio-Bollinger G.
dc.date.accessioned2020-12-04T10:06:35Z
dc.date.available2020-12-04T10:06:35Z
dc.date.issued2009
dc.identifier.doi10.1088/0957-4484/20/21/215502en
dc.identifier.urihttp://hdl.handle.net/20.500.12614/322
dc.issue.number215502en
dc.journal.titleNanotechnologyen
dc.language.isoenen
dc.rightsAtribución-NoComercial-SinDerivadas 3.0 España*
dc.rights.accessRightsopen accessen
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/*
dc.titleDynamics of quartz tuning fork force sensors used in scanning probe microscopyen
dc.typeresearch articleen
dc.volume.number20en
dspace.entity.typePublication

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