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Spectromicroscopy with low-energy electrons: LEEM and XPEEM studies at the nanoscale

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dc.contributor.affiliation"Sincrotrone Trieste S.C.P.A., Basovizza-Trieste 34149, Italy"," Instituto Madrileño de Estudios Avanzados-IMDEA Nanociencia, Cantoblanco, 28049 Madrid, Spain"en
dc.contributor.affiliation000000041762408X
dc.contributor.authorMentes T.O.
dc.contributor.authorNiño M.A.
dc.contributor.authorLocatelli A.
dc.date.accessioned2020-12-04T12:01:13Z
dc.date.available2020-12-04T12:01:13Z
dc.date.issued2011
dc.identifier.doi10.1380/ejssnt.2011.72en
dc.identifier.urihttp://hdl.handle.net/20.500.12614/959
dc.journal.titlee-Journal of Surface Science and Nanotechnologyen
dc.language.isoenen
dc.page.initial72en
dc.rightsAtribución-NoComercial-SinDerivadas 3.0 España*
dc.rights.accessRightsopen accessen
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/*
dc.titleSpectromicroscopy with low-energy electrons: LEEM and XPEEM studies at the nanoscaleen
dc.typeconference paperen
dc.volume.number9en
dspace.entity.typePublication

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