Publication:
Exciton formation dynamics at the SiO2/Si interface

dc.contributor.affiliation000000041762408X
dc.contributor.affiliationIMDEA Nanociencia, Campus Universitario de Cantoblanco, Madrid, Spainen
dc.contributor.authorRevuelta S.
dc.contributor.authorCánovas, Enrique
dc.date.accessioned2024-01-08T11:48:26Z
dc.date.available2024-01-08T11:48:26Z
dc.date.issued2023
dc.format.mimetypeapplication/pdf
dc.identifier.doi10.1038/s43246-023-00427-7
dc.identifier.urihttp://hdl.handle.net/20.500.12614/3496
dc.issue.number97
dc.journal.titleCommunications Materials
dc.language.isoen
dc.relation.projectIDTEMPWe acknowledge financial support from Grants Nos. PID2019-107808RA-I00, TED2021-129624B-C44 and CNS2022-136203 funded by MCIN/AEI/10.13039/501100011033 and by “NextGenerationEU”/PRTR. IMDEA Nanociencia acknowledges support from the ‘Severo Ochoa’ Programme for Centres of Excellence in R&D (MINECO, Grant SEV-2016-0686). We also acknowledge financial support from the Comunidad de Madrid through Projects Nos. 2017-T1/AMB-5207 and 2021–5?A/AMB-20942. We acknowledge Prof. Dr. Rodolfo Miranda and Prof. Dr. David Fuertes-Marrón for fruitful discussions about data interpretation and analysis. We also acknowledge Prof. Dr. Reinhold Wannemacher for his assistance with the cryogenic measurements.
dc.rightsAtribución-NoComercial-SinDerivadas 3.0 España*
dc.rightsAtribución-NoComercial-SinDerivadas 3.0 España*
dc.rights.accessRightsopen access
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/*
dc.titleExciton formation dynamics at the SiO2/Si interface
dc.typeresearch article
dc.type.hasVersionVoR
dc.volume.number4
dspace.entity.typePublication
relation.isAuthorOfPublicationa1d69b8d-fa00-40ab-b1df-7e999940f791
relation.isAuthorOfPublication.latestForDiscoverya1d69b8d-fa00-40ab-b1df-7e999940f791

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