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Element-specific hysteresis loop measurements on individual 35 nm islands with scanning transmission X-ray microscopy

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dc.contributor.affiliation"Laboratory for Micro-and Nanotechnology, Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland"," Instituto Madrileno de Estudios Avanzados en Nanociencia (IMDEA), Madrid 28049, Spain"," Junior Research Group Magnetic Microscopy, Experimental Physics, University of Bochum, D-44780 Bochum, Germany"," Hochschule Kempten, University of Applied Sciences, Bahnhofstrabe 61, D-87435 Kempten, Germany"," Max-Planck-Institute for Intelligent Systems, Max-Planck-Institute for Metals Research, Heisenbergstrasse 3, D-70569 Stuttgart, Germany"," Advanced Light Source (ALS), LBNL, 1 Cyclotron Road, Berkeley, CA 94720, United States"en
dc.contributor.affiliation000000041762408X
dc.contributor.authorLuo F.
dc.contributor.authorEimüller T.
dc.contributor.authorAmaladass E.
dc.contributor.authorLee M.S.
dc.contributor.authorHeyderman L.J.
dc.contributor.authorSolak H.H.
dc.contributor.authorTyliszczak T.
dc.date.accessioned2020-12-15T12:27:18Z
dc.date.available2020-12-15T12:27:18Z
dc.date.issued2012
dc.identifier.doi10.1166/jnn.2012.5778
dc.identifier.urihttp://hdl.handle.net/20.500.12614/2158
dc.journal.titleJournal of Nanoscience and Nanotechnology
dc.language.isoen
dc.page.initial2484
dc.rightsAtribución-NoComercial-SinDerivadas 3.0 España*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/*
dc.titleElement-specific hysteresis loop measurements on individual 35 nm islands with scanning transmission X-ray microscopy
dc.typeresearch article
dc.volume.number12
dspace.entity.typePublication

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