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Thickness-dependent differential reflectance spectra of monolayer and few-layer MoS2, MoSe2, WS2 and WSe2

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dc.contributor.affiliation"National Center for International Research on Green Optoelectronics & Guangdong Provincial Key Laboratory of Optical Information Materials and Technology, Institute of Electronic Paper Displays, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou, 510006, China"," Instituto Madrileño de Estudios Avanzados en Nanociencia (IMDEA Nanociencia), Campus de Cantoblanco, Madrid, E-28049, Spain"," National Key Laboratory of Science and Technology on Advanced Composites in Special Environments, Harbin Institute of Technology, Harbin, 150001, China"," Materials Science Factory, Instituto de Ciencia de Materiales de Madrid (ICMM), Consejo Superior de Investigaciones Científicas (CSIC), Sor Juana Inés de la Cruz 3, Madrid, 28049, Spain"," Institute of Solid-state Theory, University of Münster, Münster, 48149, Germany"," Institute of Physics and Center for Nanotechnology, University of Münster, Münster, 48149, Germany"," Faculty of Physics, Khaje Nasir Toosi University of Technology (KNTU), Tehr?n, 19697 64499, Iran"," Institute of Photonics, Vienna University of Technology, Gusshausstrasse 27-29, Vienna, 1040, Austria"en
dc.contributor.affiliation000000041762408X
dc.contributor.authorNiu Y.
dc.contributor.authorGonzalez-Abad S.
dc.contributor.authorFrisenda R.
dc.contributor.authorMarauhn P.
dc.contributor.authorDrüppel M.
dc.contributor.authorGant P.
dc.contributor.authorSchmidt R.
dc.contributor.authorTaghavi N.S.
dc.contributor.authorBarcons D.
dc.contributor.authorMolina-Mendoza A.J.
dc.contributor.authorde Vasconcellos S.M.
dc.contributor.authorBratschitsch R.
dc.contributor.authorDe Lara D.P.
dc.contributor.authorRohlfing M.
dc.contributor.authorCastellanos-Gomez A.
dc.date.accessioned2020-12-15T12:24:06Z
dc.date.available2020-12-15T12:24:06Z
dc.date.issued2018
dc.format.mimetypeapplication/pdf
dc.identifier.doi10.3390/nano8090725
dc.identifier.urihttp://hdl.handle.net/20.500.12614/2131
dc.issue.number725
dc.journal.titleNanomaterials
dc.language.isoen
dc.relation.projectIDinfo:eu-repo/grantAgreement/EC/H2020/785219/EU/Graphene Flagship Core Project 2/GrapheneCore2
dc.relation.projectIDinfo:eu-repo/grantAgreement/EC/H2020/755655/EU/Tunable optoelectronic devices by strain engineering of 2D semiconductors/2D-TOPSENSE
dc.relation.projectIDTEMPFunding: This project received funding from the European Research Council (ERC) under the European Union’s Horizon 2020 research, innovation programme (grant agreement No. 755655, ERC-StG 2017 project 2D-TOPSENSE), the EU Graphene Flagship funding (Grant Graphene Core 2, 785219), the Netherlands Organisation for Scientific Research (NWO) through the research program Rubicon with project number 680-50-1515, the MINECO (program FIS2015-67367-C2-1-P), and the China Scholarship Council (File NO. 201506120102).
dc.rightsAtribución-NoComercial-SinDerivadas 3.0 España*
dc.rightsAtribución-NoComercial-SinDerivadas 3.0 España*
dc.rights.accessRightsopen access
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/*
dc.titleThickness-dependent differential reflectance spectra of monolayer and few-layer MoS2, MoSe2, WS2 and WSe2
dc.typeresearch article
dc.type.hasVersionVoR
dc.volume.number8
dspace.entity.typePublication

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