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Correlative atomic force microscopy and localization-based super-resolution microscopy: Revealing labelling and image reconstruction artefacts

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dc.contributor.affiliationMadrid Institute for Advanced Studies in Nanoscience (IMDEA Nanociencia), C/Faraday 9, Madrid 28049, Spainen
dc.contributor.affiliation000000041762408X
dc.contributor.authorMonserrate A.
dc.contributor.authorCasado S.
dc.contributor.authorFlors, Cristina
dc.date.accessioned2020-12-15T12:33:10Z
dc.date.available2020-12-15T12:33:10Z
dc.date.issued2014
dc.identifier.doi10.1002/cphc.201300853en
dc.identifier.urihttp://hdl.handle.net/20.500.12614/2386
dc.journal.titleChemPhysChemen
dc.language.isoenen
dc.page.initial647en
dc.relation.projectIDinfo:eu:eu-repo/grantAgreement/EC/FP7/303620/EU/Advanced DNA imaging: improving spatial resolution and contrast through photoswitching/IMAGINDNAen
dc.rightsAtribuciĆ³n-NoComercial-SinDerivadas 3.0 EspaƱa*
dc.rights.accessRightsopen accessen
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/*
dc.titleCorrelative atomic force microscopy and localization-based super-resolution microscopy: Revealing labelling and image reconstruction artefactsen
dc.typeresearch articleen
dc.volume.number15en
dspace.entity.typePublication

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