Publication:
Thickness dependent interlayer transport in vertical MoS2 Josephson junctions

Simple item page
dc.contributor.affiliation"Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, CJ Delft, 2628, Netherlands"," Instituto Madrileno de Estudios Avanzados en Nanociencia (IMDEA Nanociencia), Campus de Cantoblanco, Madrid, E-28049, Spain"en
dc.contributor.affiliation000000041762408X
dc.contributor.authorIsland J.O.
dc.contributor.authorSteele G.A.
dc.contributor.authorVan Der Zant H.S.J.
dc.contributor.authorCastellanos-Gomez A.
dc.date.accessioned2020-12-04T11:13:03Z
dc.date.available2020-12-04T11:13:03Z
dc.date.issued2016
dc.identifier.doi10.1088/2053-1583/3/3/031002
dc.identifier.urihttp://hdl.handle.net/20.500.12614/435
dc.issue.number31002
dc.journal.title2D Materials
dc.language.isoen
dc.rightsAtribución-NoComercial-SinDerivadas 3.0 España*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/*
dc.titleThickness dependent interlayer transport in vertical MoS2 Josephson junctions
dc.typeresearch article
dc.volume.number3
dspace.entity.typePublication

Files

Collections

Publications