Publication:
Thickness dependent interlayer transport in vertical MoS2 Josephson junctions

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dc.contributor.affiliation"Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, CJ Delft, 2628, Netherlands"," Instituto Madrileno de Estudios Avanzados en Nanociencia (IMDEA Nanociencia), Campus de Cantoblanco, Madrid, E-28049, Spain"en
dc.contributor.affiliation000000041762408X
dc.contributor.authorIsland J.O.
dc.contributor.authorSteele G.A.
dc.contributor.authorVan Der Zant H.S.J.
dc.contributor.authorCastellanos-Gomez A.
dc.date.accessioned2020-12-04T11:13:03Z
dc.date.available2020-12-04T11:13:03Z
dc.date.issued2016
dc.identifier.doi10.1088/2053-1583/3/3/031002en
dc.identifier.urihttp://hdl.handle.net/20.500.12614/435
dc.issue.number31002en
dc.journal.title2D Materialsen
dc.language.isoenen
dc.rightsAtribuciĆ³n-NoComercial-SinDerivadas 3.0 EspaƱa*
dc.rights.accessRightsopen accessen
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/*
dc.titleThickness dependent interlayer transport in vertical MoS2 Josephson junctionsen
dc.typeresearch articleen
dc.volume.number3en
dspace.entity.typePublication

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