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Carbon fibre tips for scanning probe microscopy based on quartz tuning fork force sensors

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dc.contributor.affiliation"Departamento de Física de la Materia Condensada (C-III), Universidad Autónoma de Madrid, Campus de Cantoblanco, Madrid 28049, Spain"," Instituto Universitario de Ciencia de Materiales 'Nicols Cabrera', Spain"," Instituto Madril?o de Estudios Avanzados en Nanociencia, IMDEA-Nanociencia, Madrid 28049, Spain"en
dc.contributor.affiliation000000041762408X
dc.contributor.authorCastellanos-Gomez A.
dc.contributor.authorAgraït, Nicolás
dc.contributor.authorRubio-Bollinger G.
dc.date.accessioned2020-12-04T11:37:44Z
dc.date.available2020-12-04T11:37:44Z
dc.date.issued2010
dc.identifier.doi10.1088/0957-4484/21/14/145702en
dc.identifier.urihttp://hdl.handle.net/20.500.12614/679
dc.issue.number145702en
dc.journal.titleNanotechnologyen
dc.language.isoenen
dc.rightsAtribución-NoComercial-SinDerivadas 3.0 España*
dc.rights.accessRightsopen accessen
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/es/*
dc.titleCarbon fibre tips for scanning probe microscopy based on quartz tuning fork force sensorsen
dc.typeresearch articleen
dc.volume.number21en
dspace.entity.typePublication

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