Browsing by Author "Kis A."
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Publication High throughput characterization of epitaxially grown single-layer MoS2(2017) Ghasemi F.; Frisenda R.; Dumcenco D.; Kis A.; de Lara D.P.; Castellanos-Gomez A.; "Instituto Madrileño de Estudios Avanzados en Nanociencia (IMDEA-nanociencia), Campus de Cantoblanco, Madrid, E-28049, Spain"," Nanoelectronic Lab, School of Electrical and Computer Engineering, University of Tehran, Tehran, 14399-56191, Iran"," Electrical Engineering Institute, École Polytechnique Fédérale de Lausanne (EPFL), Lausanne, CH-1015, Switzerland"," Institute of Materials Science and Engineering, École Polytechnique Fédérale de Lausanne (EPFL), Lausanne, CH-1015, Switzerland"," Instituto de Ciencia de los Materiales de Madrid (ICMM-CSIC), Madrid, E-28049, Spain"; 000000041762408XPublication Micro-reflectance and transmittance spectroscopy: A versatile and powerful tool to characterize 2D materials(2017) Frisenda R.; Niu Y.; Gant P.; Molina-Mendoza A.J.; Schmidt R.; Bratschitsch R.; Liu J.; Fu L.; Dumcenco D.; Kis A.; De Lara D.P.; Castellanos-Gomez A.; "Instituto Madrileno de Estudios Avanzados en Nanociencia, IMDEA Nanociencia, Campus de Cantoblanco, Madrid, E-28049, Spain"," National Key Laboratory of Science and Technology on Advanced Composites in Special Environments, Harbin Institute of Technology, Harbin, China"," Institute of Physics and Center for Nanotechnology, University of Münster, Münster, 48149, Germany"," Laboratory of Advanced Nanomaterials, College of Chemistry and Molecular Science, Wuhan University, Wuhan, China"," Electrical Engineering Institute, Ecole Polytechnique Fédérale de Lausanne (EPFL), Lausanne, CH-1015, Switzerland"," Institute of Materials Science and Engineering, Ecole Polytechnique Fédérale de Lausanne (EPFL), Lausanne, CH-1015, Switzerland"; 000000041762408X