Browsing by Author "Bratschitsch R."
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Publication Biaxial strain in atomically thin transition metal dichalcogenides(2017) Frisenda R.; Schmidt R.; Michaelis De Vasconcellos S.; Bratschitsch R.; Pérez de Lara D.; Castellanos-Gomez A.; "Instituto Madrileño de Estudios Avanzados en Nanociencia (IMDEA-Nanociencia), Campus de Cantoblanco, Madrid, E-28049, Spain"," Institute of Physics and Center for Nanotechnology, University of Münster, Münster, 48149, Germany"," Instituto de Ciencia de Materiales de Madrid (ICMM-CSIC), Campus de Cantoblanco, Madrid, E-28049, Spain"; 000000041762408XPublication Biaxial strain tuning of the optical properties of single-layer transition metal dichalcogenides(2017) Frisenda R.; Drüppel M.; Schmidt R.; Michaelis de Vasconcellos S.; Pérez de Lara D.; Bratschitsch R.; Rohlfing M.; Castellanos-Gomez A.; "Instituto Madrileño de Estudios Avanzados en Nanociencia (IMDEA-nanociencia), Campus de Cantoblanco, Madrid, E-28049, Spain"," Institute for Solid-state Theory, University of Münster, Münster, D-48149, Germany"," Institute of Physics and Center for Nanotechnology, University of Münster, Münster, D-48149, Germany"," Instituto de Ciencia de Materiales de Madrid (ICMM-CSIC), Campus de Cantoblanco, Madrid, E-28049, Spain"; 000000041762408XPublication Enhanced visibility of MoS2, MoSe2, WSe2 and black-phosphorus: Making optical identification of 2D semiconductors easier(2015) Rubio-Bollinger G.; Guerrero R.; de Lara D.P.; Quereda J.; Vaquero-Garzon L.; Agraït, Nicolás; Bratschitsch R.; Castellanos-Gomez A.; "Dpto. De Física de la Materia Condensada, Universidad Autónoma de Madrid, Madrid, 28049, Spain"," Condensed Matter Physics Center (IFIMAC), Universidad Autónoma de Madrid, Madrid, E-28049, Spain"," Instituto Madrileño de Estudios Avanzados en Nanociencia (IMDEA-nanociencia), Campus de Cantoblanco, Madrid, E-18049, Spain"," Institute of Physics, University of Münster, Münster, D-48149, Germany"," Center for Nanotechnology, University of Münster, Münster, D-48149, Germany"; 000000041762408XPublication Micro-reflectance and transmittance spectroscopy: A versatile and powerful tool to characterize 2D materials(2017) Frisenda R.; Niu Y.; Gant P.; Molina-Mendoza A.J.; Schmidt R.; Bratschitsch R.; Liu J.; Fu L.; Dumcenco D.; Kis A.; De Lara D.P.; Castellanos-Gomez A.; "Instituto Madrileno de Estudios Avanzados en Nanociencia, IMDEA Nanociencia, Campus de Cantoblanco, Madrid, E-28049, Spain"," National Key Laboratory of Science and Technology on Advanced Composites in Special Environments, Harbin Institute of Technology, Harbin, China"," Institute of Physics and Center for Nanotechnology, University of Münster, Münster, 48149, Germany"," Laboratory of Advanced Nanomaterials, College of Chemistry and Molecular Science, Wuhan University, Wuhan, China"," Electrical Engineering Institute, Ecole Polytechnique Fédérale de Lausanne (EPFL), Lausanne, CH-1015, Switzerland"," Institute of Materials Science and Engineering, Ecole Polytechnique Fédérale de Lausanne (EPFL), Lausanne, CH-1015, Switzerland"; 000000041762408XPublication Precise and reversible band gap tuning in single-layer MoSe2 by uniaxial strain(2016) Island J.O.; Kuc A.; Diependaal E.H.; Bratschitsch R.; Van Der Zant H.S.J.; Heine T.; Castellanos-Gomez A.; "Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, CJ Delft, 2628, Netherlands"," Engineering and Science, Jacobs University Bremen Campus Ring 1, Bremen, 28779, Germany"," Wilhelm-Ostwald-Institut für Physikalische und Theoretische Chemie, Universität Leipzig, Linnéstr. 2, Leipzig, 04103, Germany"," Institute of Physics, University of Münster, Center for Nanotechnology, Münster, D-48149, Germany"," Instituto Madrileño de Estudios Avanzados en Nanociencia (IMDEA Nanociencia), Campus de Cantoblanco, Madrid, E-28049, Spain"; 000000041762408XPublication Reversible uniaxial strain tuning in atomically thin WSe2(2016) Schmidt R.; Niehues I.; Schneider R.; Drüppel M.; Deilmann T.; Rohlfing M.; De Vasconcellos S.M.; Castellanos-Gomez A.; Bratschitsch R.; "Institute of Physics, Center for Nanotechnology, University of Münster, Münster, D-48149, Germany"," Institute of Solid State Theory, University of Münster, Münster, D-48149, Germany"," Instituto Madrileñode Estudios Avanzadosen Nanociencia (IMDEA Nanociencia), Campusde Cantoblanco, Madrid, E-28049, Spain"; 000000041762408XPublication Thickness-dependent differential reflectance spectra of monolayer and few-layer MoS2, MoSe2, WS2 and WSe2(2018) Niu Y.; Gonzalez-Abad S.; Frisenda R.; Marauhn P.; Drüppel M.; Gant P.; Schmidt R.; Taghavi N.S.; Barcons D.; Molina-Mendoza A.J.; de Vasconcellos S.M.; Bratschitsch R.; De Lara D.P.; Rohlfing M.; Castellanos-Gomez A.; "National Center for International Research on Green Optoelectronics & Guangdong Provincial Key Laboratory of Optical Information Materials and Technology, Institute of Electronic Paper Displays, South China Academy of Advanced Optoelectronics, South China Normal University, Guangzhou, 510006, China"," Instituto Madrileño de Estudios Avanzados en Nanociencia (IMDEA Nanociencia), Campus de Cantoblanco, Madrid, E-28049, Spain"," National Key Laboratory of Science and Technology on Advanced Composites in Special Environments, Harbin Institute of Technology, Harbin, 150001, China"," Materials Science Factory, Instituto de Ciencia de Materiales de Madrid (ICMM), Consejo Superior de Investigaciones Científicas (CSIC), Sor Juana Inés de la Cruz 3, Madrid, 28049, Spain"," Institute of Solid-state Theory, University of Münster, Münster, 48149, Germany"," Institute of Physics and Center for Nanotechnology, University of Münster, Münster, 48149, Germany"," Faculty of Physics, Khaje Nasir Toosi University of Technology (KNTU), Tehr?n, 19697 64499, Iran"," Institute of Photonics, Vienna University of Technology, Gusshausstrasse 27-29, Vienna, 1040, Austria"; 000000041762408X